SD46
Microscopy and Microanalysis Facility

 

Welcome to the Microscopy and Microanalysis Facility

The SD46 Microscopy and Microanalysis Facility provides support for research using the techniques of:

  • Scanning electron microscopy
  • Electron-probe microanalysis
  • Energy-dispersive spectrometry
  • Wavelength-dispersive spectrometery
  • Electron backscatter diffraction
  • Electron channeling pattern analysis
  • X-ray diffraction
  • Secondary and backscattered-electron imaging
  • Optical microscopy

 


 

Contact

Paul Carpenter
Staff Scientist and Facility Manager
SD46 / USRA / NASA
Marshall Space Flight Center, AL
35812
paul.carpenter@msfc.nasa.gov

  
Analytical Techniques
Electron-Probe Microanalysis
Electron Probe Microanalyzer (JEOL JXA-8900/R)
WDS quantitative analysis
BSE & SE imaging
X-ray mapping
 
Scanning Electron Microscopy
Scanning Electron Microscope
(Zeiss DSM-960)
SE, BSE, imaging
EDS quantitative analysis
X-ray mapping
 
Optical Microscopy
Zeiss Axioplan-2 Research Optical Microscope
(Zeiss Axioplan-2)
 
X-ray Diffraction
Philips X'pert Pro MRD triple-axis diffractometer
   
C & Au Coaters


EPMA | SEM | OPT | XRD | MSFC
 All material on these pages is public information or has been previously published.
No material is of a proprietary or sensitive nature.

Curator: Paul Carpenter
NASA Contact: Donald Gillies